Ключевые слова: HTS, YBCO, coated conductors, stress effects, fatigue behavior, mechanical properties, IBAD process, RABITS process, coated conductors multifilamentary, crack formation, MOD process, MOCVD process, comparison, critical current density, degradation studies, experimental results, critical caracteristics, fabrication
Xiong X., Qiao Y., Reeves J., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R.
Ключевые слова: HTS, YBCO, coated conductors multifilamentary, filaments, geometry effects, ac losses, inkjet printing
Ключевые слова: patents, HTS, coated conductors, fabrication
Ключевые слова: patents, HTS, coated conductors, joints, design parameters
Li Y., Xiong X., Qiao Y., Xie Y., Selvamanickam V., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M.
Ключевые слова: HTS, YBCO, coated conductors, long conductors, IBAD process, buffer layers, films epitaxial, fabrication, high rate process, template layers, homogeneity, presentation, length
Ключевые слова: HTS, YBCO, coated conductors, cables single phase, design parameters, fabrication, critical current, stabilizing layers, ac losses, substrate Ni alloy, thickness dependence, mechanical properties, tensile tests, strain effects, stress effects, bending process, long conductors, MOCVD process, presentation, power equipment, critical caracteristics
Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Selvamanickam V., Chen Y., Salagaj T., Zhang E., Lensetha K.
Ключевые слова: presentation, HTS, YBCO, coated conductors, critical caracteristics, critical current, magnetic field dependence, design parameters, bending process, mechanical properties, stress effects, stabilizing layers, overcurrent, dielectric properties, breakdown characteristics, ac losses, joints, current-voltage characteristics, coated conductors multifilamentary, twisting, twist-pitch, experimental results
Thieme C.L., Goyal A., Ekin J.W., Qiao Y., Cheggour N., Clickner C.C.(clickner@boulder.nist.gov), Xie Y.-Y
Li Y., Xiong X., Qiao Y., Xie Y., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M., Selvamanickama V.
Ключевые слова: HTS, coated conductors, IBAD process, buffer layers, template layers, long conductors, fabrication, length
Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Salagaj T., Hazelton D., Reis C., Yumura H., Weber C.
Iwasa Y., Selvamanickam V., Lee H., Hahn S.-Y., Bascunan J., Jankowski J., Reeves J.(jreeves@igc.com), Knoll A.(aknoll@igc.com), Xie Y.-Y.(yxie@igc.com)
Ключевые слова: HTS, YBCO, coated conductors, stability, quench protection, test results
Ekin J.W., Li Y., Xiong X., Qiao Y., Reeves J., Knoll A., Lenseth K., Iwasa Y., Civale L., Maiorov B., Suenaga M., Selvamanickam V., Cheggour N., Chen Y., Salagaj T., Weber C., Xie Y.-Y.(yxie@igc.com), Solovyov V., Clickner C., Hou P.
Cheggour N.(cheggour@boulder.nist.gov), Ekin J.W., Feenstra R., Xie Y., Selvamanickam V., Thieme C.L.H.
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Selvamanickam V.(selva@igc.com), Lee H.G., Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Knoll A., Lenseth K.
Li Y., Qiao Y., Reeves J., Lenseth K., Selvamanickam V., Lee H.-., Xie Y.Y., Carota G., Funk M., Zdun K., Xie J., Likes K., Jones M., Hope L., Hazelton D.W.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni, IBAD process, PLD process, MOCVD process, fabrication
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